Towards spectral-domain optical coherence tomography on a silicon chip


Share/Save/Bookmark

Akca, B.I. and Nguyen, V.D. and Kalkman, J. and Leeuwen, T.G. van and Wörhoff, K. and Ridder, R.M. de and Pollnau, M. (2011) Towards spectral-domain optical coherence tomography on a silicon chip. In: International Quantum Electronics Conference and Conference on Lasers and Electro-Optics Pacific Rim, 28 August - 1 September 2011, Sydney, Australia (pp. Paper 4430).

[img] PDF
Restricted to UT campus only
: Request a copy
848kB
Abstract:We present experimental results of a spectral-domain optical coherence tomography system that includes an integrated spectrometer. A depth range of 1 mm and axial resolution of 19 μm was measured. A layered phantom was imaged.
Item Type:Conference or Workshop Item
Faculty:
Electrical Engineering, Mathematics and Computer Science (EEMCS)
Research Group:
Link to this item:http://purl.utwente.nl/publications/77969
Conference URL:http://www.iqec-cleopr2011.com/
Export this item as:BibTeX
EndNote
HTML Citation
Reference Manager

 

Repository Staff Only: item control page