Microsecond pulsed DC matching measurements on MOSFETs in strong and weak inversion


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Andricciola, Pietro and Tuinhout, Hans and Wils, Nicole and Schmitz, Jurriaan (2011) Microsecond pulsed DC matching measurements on MOSFETs in strong and weak inversion. In: 24th International Conference on Microelectronic Test Structures, ICMTS 2011, 4-7 April 2011, Amsterdam, the Netherlands (pp. pp. 90-94).

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Abstract:We present a first successful attempt to use microsecond DC pulses for matching measurements on 65-nm MOS transistors down to low current levels. We demonstrate that the interface states that contribute to the mismatch (if they indeed do so) in the weak and moderate inversion region must have charging and discharging time constants below 1 μs.
Item Type:Conference or Workshop Item
Copyright:© 2011 IEEE
Faculty:
Electrical Engineering, Mathematics and Computer Science (EEMCS)
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Link to this item:http://purl.utwente.nl/publications/77948
Official URL:http://dx.doi.org/10.1109/ICMTS.2011.5976866
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