Study of the effects of SET induced faults on submicron technologies


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Rohani, Alireza and Kerkhoff, Hans G. (2011) Study of the effects of SET induced faults on submicron technologies. In: 41st IEEE/IFIP International Conference on Dependable Systems and Networks Workshops, DSN-W 2011, 27-30 June 2011, Hong Kong.

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Abstract:the progression of shrinking technologies into
processes below 100nm has increased the importance of
transient faults in digital systems. Fault injection into the HDL
model of the system, known as simulation-based fault injection,
is being increasingly used in recent years in order to evaluate
the behaviour of systems in the presence of transient faults.
However, there are still several questions in conducting
simulation-based fault injections. For instance, what is the
importance of timing information of the netlist with regard to
the accuracy of fault injection results? And how does the
number of fault injection experiments relate to obtain a realistic
behaviour of the processor under test. Finally, what is the
dependence of fault injection results on the processor’s
workload? This paper aims to answer these questions, by
studying the effects of transient faults on a post placed-androuted
Verilog netlist of a high performance reconfigurable
processor in 90-nanometer UMC technology.
Item Type:Conference or Workshop Item
Copyright:© 2011 IEEE
Faculty:
Electrical Engineering, Mathematics and Computer Science (EEMCS)
Research Group:
Link to this item:http://purl.utwente.nl/publications/77813
Official URL:http://dx.doi.org/10.1109/DSNW.2011.5958833
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