The influence of scattering processes in quantitative X-ray fluorescence analysis

Bos, M. and Vrielink, J.A.M. (2005) The influence of scattering processes in quantitative X-ray fluorescence analysis. Analytica Chimica Acta, 545 (1). pp. 92-88. ISSN 0003-2670

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Abstract:	Existing theory was used to develop a fundamental parameter (FP) computer program for quantitative X-ray fluorescence (XRF) spectrometry in which scattering interactions are taken into account. The program is suited for polychromatic radiation and composite samples and is used to estimate the errors that result from neglecting the scattering contributions in the analysis of samples in a low Z matrix when the spectrometer is calibrated either on pure elements or on standards similar to the samples.
Item Type:	Article
Copyright:	© 2005 Elsevier
Faculty:	Science and Technology (TNW)
Research Group:	Catalytic Processes and Materials (CPM)
Link to this item:	http://purl.utwente.nl/publications/77409
Official URL:	http://dx.doi.org/10.1016/j.aca.2005.04.009
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