High-resolution integrated spectrometers in silicon-oxynitride


Akca, B.I. and Ismail, N. and Sun, F. and Driessen, A. and Wörhoff, K. and Pollnau, M. and Ridder, R.M. de (2011) High-resolution integrated spectrometers in silicon-oxynitride. In: Conference on Lasers and Electro-Optics, CLEO 2011, 1-6 May 2011, Baltimore, Maryland, USA (pp. JWA65).

[img] PDF
Restricted to UT campus only
: Request a copy
Abstract:Arrayed waveguide grating spectrometers operating around 800 nm and 1300 nm are demonstrated, with the highest resolution (0.16 nm) and largest free spectral range (77 nm) achieved in silicon-oxynitride technology to date.
Item Type:Conference or Workshop Item
Copyright:© 2011 Optical Society of America
Electrical Engineering, Mathematics and Computer Science (EEMCS)
Research Group:
Link to this item:http://purl.utwente.nl/publications/77374
Official URL:http://www.opticsinfobase.org/abstract.cfm?URI=CLEO: S and I-2011-JWA65
Export this item as:BibTeX
HTML Citation
Reference Manager


Repository Staff Only: item control page