Structural Testing of RSFQ Circuits

Share/Save/Bookmark

Joseph, Arun A. and Kerkhoff, Hans G. and Flokstra, Jaap (2005) Structural Testing of RSFQ Circuits. In: 10th International Superconductive Electronics Conference, ISEC 2005, 5-9 September 2005, Noordwijkerhout, The Netherlands (pp. PB.13).

open access
[img]
Preview
PDF
207kB
Abstract:The RSFQ family of logic circuits built in Niobium (Nb) tri-layer processes are being widely used for designs in Superconductor Electronics (SCE). But little information is available about the defects and fault mechanisms occurring in an RSFQ Nb process.
Item Type:Conference or Workshop Item
Faculty:
Electrical Engineering, Mathematics and Computer Science (EEMCS)
Research Group:
Link to this item:http://purl.utwente.nl/publications/76810
Export this item as:BibTeX
EndNote
HTML Citation
Reference Manager

 

Repository Staff Only: item control page

Metis ID: 226921