Structural Testing of RSFQ Circuits

Joseph, Arun A. and Kerkhoff, Hans G. and Flokstra, Jaap (2005) Structural Testing of RSFQ Circuits. In: 10th International Superconductive Electronics Conference, ISEC 2005, 5-9 September 2005, Noordwijkerhout, The Netherlands.

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Abstract:	The RSFQ family of logic circuits built in Niobium (Nb) tri-layer processes are being widely used for designs in Superconductor Electronics (SCE). But little information is available about the defects and fault mechanisms occurring in an RSFQ Nb process.
Item Type:	Conference or Workshop Item
Faculty:	Electrical Engineering, Mathematics and Computer Science (EEMCS)
Research Group:	Computer Architecture for Embedded Systems (CAES) Interfaces and Correlated Electron Systems (ICE)
Link to this item:	http://purl.utwente.nl/publications/76810
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Metis ID: 226921