Testability Analysis for true Mixed-Signal Integrated Circuits


Kraats, A. van de and Kerkhoff, H.G. (2005) Testability Analysis for true Mixed-Signal Integrated Circuits. In: Proceedings of IEEE 11th International Mixed Signal Test Workshop, 27-29 June 2005, Cannes, France (pp. pp. 1-6).

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Abstract:In this paper, a new procedure to derive testability measures is presented. Digital testability can be calculated by means of probability, while in analog it is possible to calculate testability using impedance values. Although attempts have been made to reach compatibility, matching was somewhat arbitrary and therefore not necessarily compatible. The concept of the new approach is that digital and analog can be integrated in a more consistent way. More realistic testability figures are obtained, which makes testability of true mixed-signal systems and circuits feasible. To verify the results, our method is compared with a sensitivity analysis, for a simple 3-bit ADC.
Item Type:Conference or Workshop Item
Additional information:sponsored by IEEE Computer Society, Test Technology Technical Council (TTTC) and TIMA Laboratory
Electrical Engineering, Mathematics and Computer Science (EEMCS)
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Link to this item:http://purl.utwente.nl/publications/76703
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