Spectral domain optical coherence tomography imaging with an integrated optics spectrometer

Nguyen, V. Duc and Akca, B. Imran and Wörhoff, Kerstin and Ridder de, René M. and Pollnau, Markus and Leeuwen van, Ton G. and Kalkman, Jeroen (2011) Spectral domain optical coherence tomography imaging with an integrated optics spectrometer. Optics Letters, 36 (7). pp. 1293-1295. ISSN 0146-9592

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Abstract:	We designed and fabricated an arrayed-waveguide grating (AWG) in silicon oxynitride as a spectrometer for spectral domain optical coherence tomography (SD-OCT). The AWG has a footprint of only 3.0 cm×2.5 cm, operates at a center wavelength of 1300 nm, and has 78 nm free spectral range. OCT measurements are performed that demonstrate imaging up to a maximum depth of 1 mm with an axial resolution of 19 μm, both in agreement with the AWG design parameters. Using the AWG spectrometer combined with a fiber-based SD-OCT system, we demonstrate cross-sectional OCT imaging of a multilayered scattering phantom.
Item Type:	Article
Copyright:	© 2011 Optical Society of America
Faculty:	Electrical Engineering, Mathematics and Computer Science (EEMCS)
Research Group:	Integrated Optical MicroSystems (IOMS)
Link to this item:	http://purl.utwente.nl/publications/76546
Official URL:	http://dx.doi.org/10.1364/OL.36.001293
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