The test search for true mixed-signal cores

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Kerkhoff, Hans G. (2005) The test search for true mixed-signal cores. Microelectronics Journal, 36 (12). pp. 1103-1111. ISSN 0026-2692

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Abstract:The well-known method towards testing mixed-signal cores is functional testing and essentially measuring key parameters of the core. However, especially if performance requirements increase, and embedded cores are considered, functional testing becomes technically and economically less attractive. A more cost-effective approach could be accomplished by a combination of reduced functional tests and added structural tests. In addition, it will also improve the debugging options for cores. Basic problem remains the large computational effort for analogue structural testing. In this paper, we introduce the concept of Testability Transfer Function for both analogue as well as digital parts in a mixed-signal core. This opens new possibilities for efficient structural testing of embedded mixed-signal cores, thereby adding to the quality of tests and/or enhanced diagnostic capabilities.
Item Type:Article
Copyright:© 2005 Elsevier
Faculty:
Electrical Engineering, Mathematics and Computer Science (EEMCS)
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Link to this item:http://purl.utwente.nl/publications/76467
Official URL:http://dx.doi.org/10.1016/j.mejo.2005.04.063
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