A Guided Mode View on Near-Field Scanning Optical Microscopy Measurements of Optical Magnetic Fields with Slit Probes


Share/Save/Bookmark

Stoffer, Remco and Hammer, Manfred and Ivanova, O.V. (Alyona) and Hoekstra, Hugo J.W.M. (2010) A Guided Mode View on Near-Field Scanning Optical Microscopy Measurements of Optical Magnetic Fields with Slit Probes. In: International Workshop on Optical Waveguide Theory and Numerical Modelling, OWTNM 2010, 9-10 april 2010, Nottingham, UK (pp. p. 62).

open access
[img]
Preview
PDF
454kB
Abstract:Recent Near-field Scanning Optical Microscopy (NSOM) experiments with slit metal coated probes claim to measure the out-of-plane optical magnetic field around a dielectric sample waveguide . The observations can also be explained by mode overlap calculations.
Item Type:Conference or Workshop Item
Faculty:
Electrical Engineering, Mathematics and Computer Science (EEMCS)
Research Group:
Link to this item:http://purl.utwente.nl/publications/76333
Conference URL:http://www.nottingham.ac.uk/ggiemr/owtnm2010/
Export this item as:BibTeX
EndNote
HTML Citation
Reference Manager

 

Repository Staff Only: item control page