Strain-induced structural changes in thin YBa2Cu3O7−x films on SrTiO3 substrates

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Vonk, V. and Reeuwijk, S.J. van and Dekkers, J.M. and Harkema, S. and Rijnders, A.J.H.M. and Graafsma, H. (2004) Strain-induced structural changes in thin YBa2Cu3O7−x films on SrTiO3 substrates. Thin Solid Films, 449 (1-2). pp. 133-137. ISSN 0040-6090

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Abstract:High-energy synchrotron radiation is used to obtain reciprocal space maps of thin YBa2Cu3O7−x films grown by pulsed laser deposition on (001) SrTiO3 substrates. The films show a transition from a tetragonal to an orthorhombic structure with increasing film thickness. The critical thickness is found to be 11.5±0.6 nm, whereas the thickness characterizing the tetragonal-to-orthorhombic transition is estimated to be 23±1 nm. Furthermore, it is shown that for miscut angles of the vicinal substrates up to approximately 1.2°, the films grow parallel to the optical surface-normal, rather than to the crystallographic c-axis of the substrates. The feasibility of using high energy X-rays allows for the use of complicated sample chambers, needed for in-situ studies of the growth and behaviour of thin films under controlled atmosphere and at elevated temperatures.
Item Type:Article
Copyright:© 2004 Elsevier
Faculty:
Science and Technology (TNW)
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Link to this item:http://purl.utwente.nl/publications/75741
Official URL:http://dx.doi.org/10.1016/j.tsf.2003.10.037
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Metis ID: 218200