A guided mode view on Near-field Scanning Optical Microscopy measurements of optical magnetic fields with slit probes

Stoffer, Remco and Hammer, Manfred and Ivanova, O.V. (Alyona) and Hoekstra, Hugo J.W.M. (2010) A guided mode view on Near-field Scanning Optical Microscopy measurements of optical magnetic fields with slit probes. In: 18th International Workshop on Optical Waveguide Theory and Numerical Modelling, OWTNM 2010, April 9-10, 2010, Cambridge, UK.

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Abstract:	Recent Near-field Scanning Optical Microscopy (NSOM) experiments with slit metal coated probes claim to measure the out-of-plane optical magnetic field around a dielectric sample waveguide [1]. The observations can also be explained by mode overlap calculations.
Item Type:	Conference or Workshop Item
Faculty:	Electrical Engineering, Mathematics and Computer Science (EEMCS)
Research Group:	Integrated Optical MicroSystems (IOMS)
Link to this item:	http://purl.utwente.nl/publications/75566
Conference URL:	http://www.nottingham.ac.uk/ggiemr/owtnm2010/
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