X-ray diffraction of ferroelectric nanodomains in PBTIO3 thin films

Catalan, G. and Vlooswijk, A.H.G. and Janssens, A. and Rispens, G. and Redfern, S. and Rijnders, G. and Blank, D.H.A. and Noheda, B. (2007) X-ray diffraction of ferroelectric nanodomains in PBTIO3 thin films. Integrated ferroelectrics, 92 (1). pp. 18-29. ISSN 1058-4587

PDF
Restricted to UT campus only: Request a copy
2613Kb

Abstract:	X-ray diffraction constitutes a powerful technique with which to characterise ferroelectric domains. Here we describe the principles of ferroelectric nanodomain diffraction and present some results for PbTiO3 thin films grown under tensile strain on two different substrates, with thicknesses below and above the critical thickness for strain relaxation. The combination of conventional and grazing incidence diffraction and the analysis of the scattering between Bragg peaks allowed the identification of a new polar symmetry in ultra-thin films with only anti-parallel 180° domains. Thick films showed tetragonal 90° ferroelectric/ferroelastic domains instead, with a depressed TC and a domain periodicity largely independent of temperature
Item Type:	Article
Copyright:	© Taylor & Francis
Faculty:	Science and Technology (TNW)
Research Group:	Inorganic Materials Science (IMS)
Link to this item:	http://purl.utwente.nl/publications/75511
Official URL:	http://dx.doi.org/10.1080/10584580701746707
Export this item as:	BibTeX EndNote HTML Citation Reference Manager

Show download statistics for this publication

Repository Staff Only: item control page

Metis ID: 246394