Theory for the measurements of dispersion characteristics in wave guiding structures with a scanning near-field optical microscope

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Hoekstra, Hugo J.W.M. and Klunder, Dion J.W. and Driessen, Alfred (2004) Theory for the measurements of dispersion characteristics in wave guiding structures with a scanning near-field optical microscope. Journal of the Optical Society of America A: Optics and image science, 21 (2). pp. 280-287. ISSN 0740-3232

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Abstract:A theory is presented for the interpretation of scanning near-field optical microscope measurements on pulses propagating in waveguiding structures. It is shown how the dispersion characteristics of the propagating guided modes may be derived from such experiments. Then it is demonstrated how to calibrate the scanning tip position and to derive experimental values for reflection and transmission of modes in identical single-mode waveguides connected to a photonic device such as a micro cavity.
Item Type:Article
Copyright:© 2004 Optical Society of America
Faculty:
Electrical Engineering, Mathematics and Computer Science (EEMCS)
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Link to this item:http://purl.utwente.nl/publications/75349
Official URL:http://dx.doi.org/10.1364/JOSAA.21.000280
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Metis ID: 220465