Multivariate Model for Test Response Analysis


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Krishnan, Shaji and Kerkhoff, Hans G. (2010) Multivariate Model for Test Response Analysis. In: 15th IEEE European Test Symposium, ETS 2010, 24-28 May 2010, Praha, Czech Republic.

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Abstract:A systematic approach to construct an effective multivariate test response model for capturing manufacturing defects in electronic products is described. The effectiveness of the model is demonstrated by its capability in reducing the number of test-points, while achieving the maximal coverage attainable by the specific test method on an industrial circuit.
Item Type:Conference or Workshop Item
Copyright:© 2010 IEEE
Faculty:
Electrical Engineering, Mathematics and Computer Science (EEMCS)
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Link to this item:http://purl.utwente.nl/publications/75308
Official URL:http://dx.doi.org/10.1109/ETSYM.2010.5512743
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