SiON integrated optics elliptic couplers for Fizeau-based Optical Coherence Tomography

Nguyen, V.D. and Leeuwen van, T.J. and Kalkman, J. and Ismail, N. and Sun, F. and Akca, B.I. and Driessen, A. and Pollnau, M. and Ridder de, R.M. and Wörhoff, K. (2010) SiON integrated optics elliptic couplers for Fizeau-based Optical Coherence Tomography. In: 15th European Conference on Integrated Optics, ECIO 2010, 7-9 April 2010, Cambridge, United Kingdom.

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Abstract:	The use of integrated optics for Optical Coherence Tomography (OCT) can offer significant cost reductions and new applications. We designed, fabricated, and characterized Silicon oxynitride (SiON) elliptic couplers that are used to focus light from a chip into the off-chip environment. Fizeau-based OCT measurements are performed and compared to calculations.
Item Type:	Conference or Workshop Item
Copyright:	© 2010 IEEE
Faculty:	Electrical Engineering, Mathematics and Computer Science (EEMCS)
Research Group:	Integrated Optical MicroSystems (IOMS)
Link to this item:	http://purl.utwente.nl/publications/75256
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