Enhanced diffusion upon amorphous-to-nanocrystalline phase transition in Mo/B4C/Si layered systems

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Rooij-Lohmann, V.I.T.A. de and Yakshin, A.E. and Kruijs, R.W.E. van de and Zoethout, E. and Kleyn, A.W. and Keim, E.G. and Gorgoi, M. and Schäfers, F. and Brongersma, H.H. and Bijkerk, F. (2010) Enhanced diffusion upon amorphous-to-nanocrystalline phase transition in Mo/B4C/Si layered systems. Journal of Applied Physics, 108 (1). 014314. ISSN 0021-8979

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Abstract:The effect of an amorphous-to-nanocrystalline phase transition on the diffusion across an interface layer of subnanometer thickness has been investigated in real-time. The diffusion in the Mo/B4C/Si thin film structure studied was found to instantaneously enhance by an order of magnitude upon the formation of nanocrystals inducing the atomic-scale onset of grain boundary diffusion
Item Type:Article
Copyright:© 2010 American Institute of Physics
Faculty:
Electrical Engineering, Mathematics and Computer Science (EEMCS)
Science and Technology (TNW)
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Link to this item:http://purl.utwente.nl/publications/75239
Official URL:http://dx.doi.org/10.1063/1.3460107
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