Integrated AWG spectrometer for on-chip optical coherence tomography and Raman spectroscopy

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Akca, B.I. and Ismail, N. and Sun, F. and Driessen, A. and Wörhoff, K. and Pollnau, M. and Ridder de, R.M. and Nguyen, V.D. and Kalkman, J. and Leeuwen van, T.G. (2010) Integrated AWG spectrometer for on-chip optical coherence tomography and Raman spectroscopy. In: 15th European Conference on Integrated Optics, ECIO 2010, 7-9 April 2010, Cambridge, United Kingdom.

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Abstract:Silicon oxynitride-based arrayed waveguide grating (AWG) spectrometers were designed for on-chip spectral-domain optical coherence tomography (OCT) systems and Raman spectroscopy of the skin. A novel geometrical layout for Raman spectroscopy was introduced to reduce loss. Measurements show that integrated optics has a good potential for miniaturizing current OCT systems
Item Type:Conference or Workshop Item
Copyright:© 2010 IEEE
Faculty:
Electrical Engineering, Mathematics and Computer Science (EEMCS)
Science and Technology (TNW)
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Link to this item:http://purl.utwente.nl/publications/75218
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