Interface engineering and strain in YBa2Cu3O7-δ thin films


Huijben, Mark and Koster, Gertjan and Blank, Dave H.A. and Rijnders, Guus (2008) Interface engineering and strain in YBa2Cu3O7-δ thin films. Phase Transitions, 81 (7-8). pp. 703-716. ISSN 0141-1594

[img] PDF
Restricted to UT campus only
: Request a copy
Abstract:In thin films, new phases can be encountered near interfaces, whether it is the substrate-film interface or subsequent interfaces in the case of heterostructures. Both structural properties and surface morphology are a direct result of the thin film growth, controlled by deposition conditions and substrate properties, which in turn influence the electrical properties and determine their applicability in multilayer structures. At the initial growth stage, the stacking sequence of the individual atomic layers at the interface with the substrate is influenced by the substrate surface properties. During subsequent deposition, the lattice mismatch between substrate and growing film becomes dominant. In this article, an overview is given of the complex growth mechanisms of YBa2Cu3O7-δ on SrTiO3 substrates. The afore mentioned issues will be addressed, with a focus on initial growth, interface engineering and strain, leading to phases that are different from the bulk both structurally and in their superconducting properties.
Item Type:Article
Copyright:©Taylor & Francis
Science and Technology (TNW)
Research Group:
Link to this item:
Official URL:
Export this item as:BibTeX
HTML Citation
Reference Manager


Repository Staff Only: item control page

Metis ID: 250724