Testability-analysis driven test-generation of analogue cores


Stancic, M. and Kerkhoff, H.G. (2003) Testability-analysis driven test-generation of analogue cores. Microelectronics Journal, 34 (10). pp. 913-917. ISSN 0026-2692

[img] PDF
Restricted to UT campus only
: Request a copy
Abstract:A new definition of the testability transfer factor for circuit components that provides better sensitivity with respect to parametric deviations is presented. New equations for the testability measures in a mixed-signal core are given. Testability analysis is used for test-pattern generation and for consideration of inserting wrapper cells. The simulation results show the effectiveness of the approach.
Item Type:Article
Copyright:© 2003 Elsevier
Electrical Engineering, Mathematics and Computer Science (EEMCS)
Research Group:
Link to this item:http://purl.utwente.nl/publications/75196
Official URL:https://doi.org/10.1016/S0026-2692(03)00159-9
Export this item as:BibTeX
HTML Citation
Reference Manager


Repository Staff Only: item control page

Metis ID: 215130