Testability-analysis driven test-generation of analogue cores

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Stancic, M. and Kerkhoff, H.G. (2003) Testability-analysis driven test-generation of analogue cores. Microelectronics Journal, 34 (10). pp. 913-917. ISSN 0026-2692

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Abstract:A new definition of the testability transfer factor for circuit components that provides better sensitivity with respect to parametric deviations is presented. New equations for the testability measures in a mixed-signal core are given. Testability analysis is used for test-pattern generation and for consideration of inserting wrapper cells. The simulation results show the effectiveness of the approach.
Item Type:Article
Copyright:© 2003 Elsevier
Faculty:
Electrical Engineering, Mathematics and Computer Science (EEMCS)
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Link to this item:http://purl.utwente.nl/publications/75196
Official URL:http://dx.doi.org/10.1016/S0026-2692(03)00159-9
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Metis ID: 215130