In Situ Resistivity Measurements and Optical Transmission and Reflection Spectroscopy of Electrochemically Loaded Switchable YHx Films

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Kooij, E.S. and Gogh van, A.T.M. and Griessen, R. (1999) In Situ Resistivity Measurements and Optical Transmission and Reflection Spectroscopy of Electrochemically Loaded Switchable YHx Films. Journal of the Electrochemical Society, 146 (8). pp. 2990-2994. ISSN 0013-4651

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Abstract:We describe an experimental method for in situ resistivity measurements during the electrochemical hydrogen loading of thin, switchable metal hydride films. Using an oxygen-free electrolyte we are able to measure the hydrogen concentration in the films quantitatively and to determine the pressure-composition isotherms and the hydrogen concentration dependence of the resistivity. Furthermore, the optical properties can be investigated by simultaneous transmission and reflection spectroscopy. The power of these in situ measurements is discussed on the basis of results obtained on YHx films; possibilities for additional experiments are briefly described
Item Type:Article
Copyright:©1999 The Electrochemical Society
Link to this item:http://purl.utwente.nl/publications/75184
Official URL:http://dx.doi.org/10.1149/1.1392040
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