Optical Properties of Poly(ferrocenylsilane) Multilayer Thin Films

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Kooij, E. Stefan and Ma, Yujie and Hempenius, Mark A. and Vancso, G. Julius and Poelsema, Bene (2010) Optical Properties of Poly(ferrocenylsilane) Multilayer Thin Films. Langmuir, 26 (17). pp. 14177-14181. ISSN 0743-7463

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Abstract:Spectroscopic ellipsometry has been used to investigate the optical properties of poly(ferrocenylsilane) polyion multilayer thin films in the visible and near-infrared range of the spectrum. The thin films were deposited using the layer-by-layer assembly process. Films with thicknesses of up to 55 nm were fabricated stepwise from polyelectrolyte solutions with a controlled ionic strength. These films allow an accurate characterization of the optical properties of poly(ferrocenylsilane) polyion layers. We show that the complex refractive index can be described by a simple Cauchy model. Refractive index values vary over the spectral range from 1.53 (near-infrared) to 1.8 (ultraviolet).
Item Type:Article
Copyright:© 2010 American Chemical Society
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Science and Technology (TNW)
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Link to this item:http://purl.utwente.nl/publications/75145
Official URL:http://dx.doi.org/10.1021/la101583t
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