Dependable Digitally-Assisted Mixed-Signal IPs Based on Integrated Self-Test & Self-Calibration


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Kerkhoff, Hans G. and Wan, Jinbo (2010) Dependable Digitally-Assisted Mixed-Signal IPs Based on Integrated Self-Test & Self-Calibration. In: IEEE 16th InternationalMixed-Signals, Sensors and Systems Test Workshop, IMS3TW 2010, 7-9 June 2010, La Grande Motte, France (pp. pp. 1-6).

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Abstract:Heterogeneous SoC devices, including sensors, analogue and mixed-signal front-end circuits and the availability of massive digital processing capability, are being increasingly used in safety-critical applications like in the automotive, medical, and the security arena. Already a significant amount of attention has been paid in literature with respect to the dependability of the digital parts in heterogeneous SoCs. This is in contrast to especially the sensors and front-end mixed-signal electronics; these are however particular sensitive to external influences over time and hence determining their dependability. This paper provides an integrated SoC/IP approach to enhance the dependability. It will give an example of a digitally-assisted mixed-signal front-end IP which is being evaluated under its mission profile of an automotive tyre pressure monitoring system. It will be shown how internal monitoring and digitally-controlled adaptation by using embedded processors can help in terms of improving the dependability of this mixed-signal part under harsh conditions for a long time.
Item Type:Conference or Workshop Item
Copyright:© 2010 IEEE
Faculty:
Electrical Engineering, Mathematics and Computer Science (EEMCS)
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Link to this item:http://purl.utwente.nl/publications/75047
Official URL:http://dx.doi.org/10.1109/IMS3TW.2010.5503008
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