Adding synchronous and LSSD modes to asynchronous circuits

Berkel van, Kees and Peeters, Ad and Beest te, Frank (2003) Adding synchronous and LSSD modes to asynchronous circuits. Microprocessors and Microsystems, 27 (9). pp. 461-471. ISSN 0141-9331

PDF
Restricted to UT campus only: Request a copy
223Kb

Abstract:	A synchronous mode as well as a scan mode of operation are added to a large class of asynchronous circuits, in compliance with LSSD design rules. This enables the application of mainstream tools for design-for-testability and test-pattern generation to asynchronous circuits. The approach is based on a systematic transformation of all single-output sequential gates into synchronous and scannable versions. By exploiting dynamic circuit operation in scan mode, the overhead of this transformation in terms of both circuit cost and circuit delay is kept minimal.
Item Type:	Article
Copyright:	© 2003 Elsevier
Faculty:	Electrical Engineering, Mathematics and Computer Science (EEMCS)
Research Group:	Computer Architecture for Embedded Systems (CAES)
Link to this item:	http://purl.utwente.nl/publications/75026
Official URL:	http://dx.doi.org/10.1016/S0141-9331(03)00095-4
Export this item as:	BibTeX EndNote HTML Citation Reference Manager

Show download statistics for this publication

Repository Staff Only: item control page

Metis ID: 215131