BlockLevel Bayesian Diagnosis of Analogue Electronic Circuits
Krishnan, Shaji and Doornbosch, Klaas D. and Brand , Rudi and Kerkhoff, Hans G. (2010) BlockLevel Bayesian Diagnosis of Analogue Electronic Circuits. In: Design, Automation & Test in Europe Conference & Exhibition, DATE 2010, 8-12 March 2010, Dresden, Germany (pp. pp. 1767-1772).
|Abstract:||Daily experience with product designers, test and diagnosis engineers it is realized that the depth of interaction among them, ought to be high for successful diagnosis of analogue circuits. With this knowledge in mind, a responsibility was undertaken to choose a popular diagnostic method and define a systematic procedure that binds together the knowledge of a product from a design, test and diagnostic engineer. A set
of software utilities was developed that assists in automating these procedures and in collecting appropriate data for effective diagnosis of analogue circuits. This paper will discuss the chosen methodology for diagnosis and the associated procedures for block-level diagnosis of analogue electronic circuits in detail.
The paper is concluded with an illustration of the methodology and the related procedures of an industrial automotive voltage regulator circuit as a representative example.
|Item Type:||Conference or Workshop Item|
|Copyright:||© 2010 IEEE|
Electrical Engineering, Mathematics and Computer Science (EEMCS)
|Link to this item:||http://purl.utwente.nl/publications/74978|
|Export this item as:||BibTeX|
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