Determination of diffusion profiles of silver ions in soda-lime–silica glass by X-ray fluorescence spectrometry

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Bos, M. and Boukamp, B.A. and Vrielink, J.A.M. (2002) Determination of diffusion profiles of silver ions in soda-lime–silica glass by X-ray fluorescence spectrometry. Analytica Chimica Acta, 459 (2). pp. 305-311. ISSN 0003-2670

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Abstract:A nondestructive method based on X-ray fluorescence (XRF) spectrometry is presented for the determination of concentration-depth profiles in the top layer of flat solid samples. The method was tested in the determination of the interdiffusion coefficient of silver and sodium ions in soda-lime–silica glass. Calculations are based on semi-infinite diffusion with constant boundary concentration of the silver ion. The diffusion coefficient found at 633 K for penetration times between 300 and 3600 s ranged between 1.1×10−10 and 1.6×10−10 cm2 s−1.
Item Type:Article
Copyright:© 2002 Elsevier
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Link to this item:http://purl.utwente.nl/publications/74852
Official URL:http://dx.doi.org/10.1016/S0003-2670(02)00136-8
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Metis ID: 208810