Modeling electromigration as a fluid–gas system

Schoenmaker, Wim and Petrescu, Violeta (1999) Modeling electromigration as a fluid–gas system. Microelectronics Reliability, 39 (11). pp. 1667-1676. ISSN 0026-2714

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Abstract:	In this paper two problems in modeling electromigration are addressed. The first problem is an issue of principle concerning counting the number of variables and the number of equations for formulating a well-posed mathematical problem. The second problem deals with setting up a system of equations which are sufficiently detailed for performing computer simulations of the local dynamics governing electromigration phenomena, and which also keep the CPU consumption within acceptable limits. A model for electromigration, which is based on a fluid–gas picture for the material transport, is proposed for dealing with both questions. The flow of matter is described as a combined flow of lattice sites and a flow of vacancies. The gas component is used to describe the vacancy flux.
Item Type:	Article
Copyright:	© 1999 Elsevier
Research Group:	Semiconductor Components (SC)
Link to this item:	http://purl.utwente.nl/publications/74208
Official URL:	http://dx.doi.org/10.1016/S0026-2714(99)00173-0
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