On the formation of oriented nanometer scale patterns on amorphous polymer surfaces studied by atomic force microscopy

Share/Save/Bookmark

Pickering, J.P. and Vancso, G.J. (1999) On the formation of oriented nanometer scale patterns on amorphous polymer surfaces studied by atomic force microscopy. Applied Surface Science, 148 (3-4). pp. 147-154. ISSN 0169-4332

[img]PDF
Restricted to UT campus only
: Request a copy
415Kb
Abstract:Nanometer scale patterns were formed on the surface of several amorphous polystyrenes by a scanning probe microscope (SPM) operating in the contact mode. In order to better understand the nature of their formation, samples of several molar masses were systematically examined at room temperature in ambient conditions as well as in a liquid cell. The formation of the surface patterns was found to depend strongly upon the apparent tip radius, applied normal loading and time of scanning. The experimental results are analyzed by considering the plastic deformation of the glassy polymer subjected to high stresses by the sharp stylus of the scanning probe. Contact mechanics theory is applied to provide an estimate of the normal and shear stresses. Limitations of these theories are discussed. New results are presented that show that surface deformation occurs beyond a critical normal loading.
Item Type:Article
Copyright:© 1999 Elsevier
Faculty:
Science and Technology (TNW)
Research Group:
Link to this item:http://purl.utwente.nl/publications/74177
Official URL:http://dx.doi.org/10.1016/S0169-4332(99)00220-2
Export this item as:BibTeX
EndNote
HTML Citation
Reference Manager

 

Repository Staff Only: item control page

Metis ID: 105754