Testable design and testing of high-speed superconductor microelectronics


Kerkhoff, Hans G. and Joseph, Arun A. and Heuvelmans, Sander (2004) Testable design and testing of high-speed superconductor microelectronics. In: First IEEE International Workshop on Electronic Design, Test and Applications, DELTA 2002, 29-31 Jan 2002 , Christchurch, New Zealand (pp. pp. 8-12).

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Abstract:True software-defined radio cellular base stations require extremely fast data converters, which can not currently be implemented in semiconductor technology. Superconductor niobium-based delta ADCs have shown to be able to perform this task. The problem of testing these devices is a severe task, as very little is known about possible defects in this technology. This paper shows an approach for gaining information on these defects and illustrates how BIST can be a solution of detecting defects in ADCs under extreme conditions.
Item Type:Conference or Workshop Item
Copyright:© 2002 IEEE
Electrical Engineering, Mathematics and Computer Science (EEMCS)
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Link to this item:http://purl.utwente.nl/publications/74029
Official URL:https://doi.org/10.1109/DELTA.2002.994580
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