Testable design and testing of high-speed superconductor microelectronics

Kerkhoff, Hans G. and Joseph, Arun A. and Heuvelmans, Sander (2004) Testable design and testing of high-speed superconductor microelectronics. In: First IEEE International Workshop on Electronic Design, Test and Applications, DELTA 2002, 29-31 Jan 2002 , Christchurch, New Zealand.

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Abstract:	True software-defined radio cellular base stations require extremely fast data converters, which can not currently be implemented in semiconductor technology. Superconductor niobium-based delta ADCs have shown to be able to perform this task. The problem of testing these devices is a severe task, as very little is known about possible defects in this technology. This paper shows an approach for gaining information on these defects and illustrates how BIST can be a solution of detecting defects in ADCs under extreme conditions.
Item Type:	Conference or Workshop Item
Copyright:	© 2002 IEEE
Faculty:	Electrical Engineering, Mathematics and Computer Science (EEMCS)
Research Group:	Computer Architecture for Embedded Systems (CAES)
Link to this item:	http://purl.utwente.nl/publications/74029
Official URL:	http://dx.doi.org/10.1109/DELTA.2002.994580
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