Optimum IR measurement conditions for thin layers on dielectric surfaces

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Kosters, P.G.H. and Kooyman, R.P.H. (1998) Optimum IR measurement conditions for thin layers on dielectric surfaces. Thin Solid Films, 327-32 . pp. 283-286. ISSN 0040-6090

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Abstract:The importance of signal-to-noise ratio (SNR) calculations for an optimum Fourier transform-infrared spectroscopy (FT-IR) detection of thin, isotropic layers on dielectric substrates is discussed; some illustrative examples are given. It is found that the SNR increases with increasing refractive index of the substrate whereas the use of p-polarized light is preferable. Optimum measurement conditions for oriented layers were found for a Ge substrate at an angle of incidence of 50–55°.
Item Type:Article
Copyright:© 1998 Elsevier
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Science and Technology (TNW)
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Link to this item:http://purl.utwente.nl/publications/73900
Official URL:http://dx.doi.org/10.1016/S0040-6090(98)00645-2
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