Imaging of Order Parameter Induced π Phase Shifts in Cuprate Superconductors by Low-Temperature Scanning Electron Microscopy

Share/Save/Bookmark

Gürlich, Christian and Goldobin, Edward and Straub, Rainer and Doenitz, Dietmar and Ariando and Smilde, Henk Jan H. and Hilgenkamp, Hans and Kleiner, Reinhold and Koelle, Dieter (2009) Imaging of Order Parameter Induced π Phase Shifts in Cuprate Superconductors by Low-Temperature Scanning Electron Microscopy. Physical Review Letters, 103 (6). 067011. ISSN 0031-9007

open access
[img]
Preview
PDF
701kB
Abstract:Low-temperature scanning electron microscopy (LTSEM) has been used to image the supercurrent distribution in ramp-type Josephson junctions between Nb and either the electron-doped cuprate Nd2-xCexCuO4-y or the hole-doped cuprate YBa2Cu3O7. For zigzag-shaped devices in the short junction limit the critical current is strongly suppressed at zero applied magnetic field. The LTSEM images show that this is due to the Josephson current counterflow in neighboring 0 and π facets, which is induced by the dx2-y2 order parameter in the cuprates. Thus, LTSEM provides imaging of the sign change of the superconducting order parameter, which can also be applied to other types of Josephson junctions.
Item Type:Article
Copyright:© 2009 The American Physical Society
Faculty:
Science and Technology (TNW)
Research Group:
Link to this item:http://purl.utwente.nl/publications/73637
Official URL:http://dx.doi.org/10.1103/PhysRevLett.103.067011
Export this item as:BibTeX
EndNote
HTML Citation
Reference Manager

 

Repository Staff Only: item control page

Metis ID: 261976