Use of Scanning Tunnelling Microscopy for Atomic Manipulation on Semiconductors

Houselt van, Arie and Zandvliet, Harold J.W. (2008) Use of Scanning Tunnelling Microscopy for Atomic Manipulation on Semiconductors. Microscopy and Analysis, 22 (2). S5-S8. ISSN 0958-1952

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Abstract:	The scanning tunnelling microscope (STM) can be used as a tool for assembling nanostructures at the atomic level. In this article we briefly review several pathways for controlled manipulation of atoms and molecules on semiconductor surfaces at room temperature. As an illustrative example we discuss the controlled manipulation of atomic platinum chains. We were able to carry the constituting dimers of the atomic Pt chains from point to point with atomic precision at room temperature. Besides the ultimate control of the surface structure we also show that the manipulated Pt dimer can be attached to the apex of the STM tip in various stable configurations.
Item Type:	Article
Copyright:	© 2008 John Wiley & Sons, Ltd.
Faculty:	Science and Technology (TNW)
Research Group:	Catalytic Processes and Materials (CPM) Physics of Interfaces and Nanomaterials (PIN)
Link to this item:	http://purl.utwente.nl/publications/73054
Official URL:	http://www.microscopy-analysis.com/files/jwiley_microscopy/2008_Mar_Houselt.pdf
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