Determination of thickness and dielectric constant of thin transparent dielectric layers using surface plasmon resonance

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Bruijn de, Helene E. and Altenburg, Bert S.F. and Kooyman, Rob P.H. and Greve, Jan (1991) Determination of thickness and dielectric constant of thin transparent dielectric layers using surface plasmon resonance. Optics Communications, 82 (5-6). pp. 425-432. ISSN 0030-4018

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Abstract:The determination of the thickness and dielectric constant of thin dielectric layers by means of surface plasmon resonance is discussed. It appears to be impossible to determine these parameters from one surface plasmon response experiment. This is illustrated theoretically. Variation of the refractive index of the solution in which surface plasmon experiments were performed allowed us to determine these parameters separately.
Item Type:Article
Copyright:© 1991 Elsevier
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Science and Technology (TNW)
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Link to this item:http://purl.utwente.nl/publications/72953
Official URL:http://dx.doi.org/10.1016/0030-4018(91)90353-F
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Metis ID: 129441