Study of dynamic processes on semiconductor surfaces using time-resolved scanning tunneling microscopy

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Saedi, Amirmehdi and Poelsema, Bene and Zandvliet, Harold J.W. (2010) Study of dynamic processes on semiconductor surfaces using time-resolved scanning tunneling microscopy. Journal of Physics: Condensed matter, 22 (26). p. 264007. ISSN 0953-8984

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Abstract:The time resolution of a conventional scanning tunneling microscope can be improved by many orders of magnitude by recording open feedback loop current–time traces. The enhanced time resolution comes, however, at the expense of the ability to obtain spatial information. In this paper, we first consider the Ge(111)-c(2 × 8) surface as an example of how surface dynamics can show up in conventional STM images. After a brief introduction to the time-resolved scanning tunneling microscopy technique, its capabilities will be demonstrated by addressing the dynamics of a dimer pair of a Pt modified Ge(001).
Item Type:Article
Copyright: © IOP Publishing 2010
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Science and Technology (TNW)
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Link to this item:http://purl.utwente.nl/publications/72803
Official URL:http://dx.doi.org/10.1088/0953-8984/22/26/264007
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