Dielectric-permittivity-driven charge carrier modulation at oxide interfaces

Siemons, Wolter and Huijben, Mark and Rijnders, Guus and Blank, Dave H.A. and Geballe, Theodore H. and Beasley, Malcolm R. and Koster, Gertjan (2010) Dielectric-permittivity-driven charge carrier modulation at oxide interfaces. Physical Review B: Condensed matter and materials physics, 81 (24). p. 241308. ISSN 1098-0121

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Abstract:	High-quality bilayers of La-doped SrTiO3 (STO) and LaAlO3 (LAO) on SrTiO3 have been grown controlling the location and behavior of the charge carriers by changing the thicknesses of the layers, which are dielectrically mismatched. In this system, the charge carriers are created at the La:SrTiO3/LAO interface and spread out toward the substrate due to the increase in dielectric constant as the temperature is lowered. When the electrons reach the interface of the La:SrTiO3 and the pure STO, they display enhanced mobility in the quantum well at that interface for specific thicknesses.
Item Type:	Article
Copyright:	APS
Faculty:	Science and Technology (TNW)
Research Group:	Inorganic Materials Science (IMS)
Link to this item:	http://purl.utwente.nl/publications/72317
Official URL:	http://dx.doi.org/10.1103/PhysRevB.81.241308
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