Compositional Mapping of Polymer Surfaces by Chemical Force Microscopy Down to the Nanometer Scale: Reactions in Block Copolymer Microdomains

Schönherr, Holger and Feng, Chuan Liang and Tomczak, Nikodem and Vancso, G. Julius (2005) Compositional Mapping of Polymer Surfaces by Chemical Force Microscopy Down to the Nanometer Scale: Reactions in Block Copolymer Microdomains. Macromolecular Symposia, 230 (1). pp. 149-157. ISSN 1022-1360

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Abstract:	The laterally resolved analysis of the chemical surface composition of surface-treated block copolymers by atomic force microscopy (AFM) pull-off force mapping in the force volume (FV) mode and the automated analysis of the FV data is discussed. Poly(tert-butyl acrylate) (PtBA) microdomains residing in a polystyrene (PS) matrix at the surface of cyclohexane-treated polystyrene-block-poly(tert-butyl acrylate) (PtBA-b-PS) block copolymer thin films were domain-selectively deprotected, activated and chemically modified, as also shown by fluorescence microscopy. AFM pull-off force mapping in conjunction with an automated analysis of the data provided real space evidence for the successful conversion of reactive esters located in the PtBA domains and showed that AFM and related approaches, such as chemical force microscopy (CFM), can indeed contribute to assess changes in heterogeneous surface chemical composition of polymers down to sub-50 nm length scales.
Item Type:	Article
Copyright:	© 2005 Wiley InterScience
Faculty:	Science and Technology (TNW)
Research Group:	Materials Science and Technology of Polymers (MTP)
Link to this item:	http://purl.utwente.nl/publications/72024
Official URL:	http://dx.doi.org/10.1002/masy.200551154
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