Compositional Mapping of Polymer Surfaces by Chemical Force Microscopy Down to the Nanometer Scale: Reactions in Block Copolymer Microdomains

Share/Save/Bookmark

Schönherr, Holger and Feng, Chuan Liang and Tomczak, Nikodem and Vancso, G. Julius (2005) Compositional Mapping of Polymer Surfaces by Chemical Force Microscopy Down to the Nanometer Scale: Reactions in Block Copolymer Microdomains. Macromolecular Symposia, 230 (1). pp. 149-157. ISSN 1022-1360

[img]PDF
Restricted to UT campus only
: Request a copy
392Kb
Abstract:The laterally resolved analysis of the chemical surface composition of surface-treated block copolymers by atomic force microscopy (AFM) pull-off force mapping in the force volume (FV) mode and the automated analysis of the FV data is discussed. Poly(tert-butyl acrylate) (PtBA) microdomains residing in a polystyrene (PS) matrix at the surface of cyclohexane-treated polystyrene-block-poly(tert-butyl acrylate) (PtBA-b-PS) block copolymer thin films were domain-selectively deprotected, activated and chemically modified, as also shown by fluorescence microscopy. AFM pull-off force mapping in conjunction with an automated analysis of the data provided real space evidence for the successful conversion of reactive esters located in the PtBA domains and showed that AFM and related approaches, such as chemical force microscopy (CFM), can indeed contribute to assess changes in heterogeneous surface chemical composition of polymers down to sub-50 nm length scales.
Item Type:Article
Copyright:© 2005 Wiley InterScience
Faculty:
Science and Technology (TNW)
Research Group:
Link to this item:http://purl.utwente.nl/publications/72024
Official URL:http://dx.doi.org/10.1002/masy.200551154
Export this item as:BibTeX
EndNote
HTML Citation
Reference Manager

 

Repository Staff Only: item control page

Metis ID: 230193