Characterization of Grain Boundaries in Superplastically Deformed Y-TZP Ceramics

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Boutz, Michel M.R. and Chen, Chu Sheng and Winnubst, Louis and Burggraaf, Anthonie J. (1994) Characterization of Grain Boundaries in Superplastically Deformed Y-TZP Ceramics. Journal of the American Ceramic Society, 77 (10). pp. 2632-2640. ISSN 0002-7820

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Abstract:The effects of compressive deformation on the grain boundary characteristics of fine-grained Y-TZP have been investigated using surface spectroscopy, impedance analysis, and transmission electron microscopy. After sintering at low temperature (1150°C), the grain boundaries are covered by an ultrathin (1nm) yttrium-rich amorphous film. After deformation at 1200°–1300°C under low stress, some grain boundaries are no longer covered by the amorphous film. Yttrium segregation seems to occur only at wetted grain boundaries. Evidence has been found that the extent of dewetting increases with increasing applied stress.
Item Type:Article
Copyright:© 1994 Wiley InterScience
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Science and Technology (TNW)
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Link to this item:http://purl.utwente.nl/publications/71070
Official URL:http://dx.doi.org/10.1111/j.1151-2916.1994.tb04654.x
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Metis ID: 106871