Electromigration early resistance increase measurements

Niehof, J. and Flinn, P.A. and Maloney, T.J. (1993) Electromigration early resistance increase measurements. Quality and Reliability Engineering International, 9 (4). pp. 295-298. ISSN 0748-8017

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Abstract:	An early resistance change measurement set-up, using an AC bridge technique, has been developed, and measurements have been performed. Large sample-to-sample variations occur. The characteristic time for the resistance change curve is shorter for resistance increase (under current stress) than for resistance decay (during recovery).
Item Type:	Article
Copyright:	© 1993 Wiley InterScience
Faculty:	Electrical Engineering, Mathematics and Computer Science (EEMCS)
Research Group:	Semiconductor Components (SC)
Link to this item:	http://purl.utwente.nl/publications/71007
Official URL:	http://dx.doi.org/10.1002/qre.4680090409
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