Reliability improvement of electronic circuits based on physical failure mechanisms in components

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Brombacher, A.C. and Boer, H.A. de and Bennion, M. and Fennema, P.H. and Hermann, O.E. (1991) Reliability improvement of electronic circuits based on physical failure mechanisms in components. Quality and Reliability Engineering International, 7 (4). pp. 267-273. ISSN 0748-8017

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Abstract:Traditionally the position of reliability analysis in the design and production process of electronic circuits is a position of reliability verification. A completed design is checked on reliability aspects and either rejected or accepted for production. This paper describes a method to model physical failure mechanisms within components in such a way that they can be used for reliability optimization, not after, but during the early phase of the design process. Furthermore a prototype of a CAD software tool is described, which can highlight components likely to fail and automatically adjust circuit parameters to improve product reliability.
Item Type:Article
Copyright:© 1990 Wiley InterScience
Faculty:
Electrical Engineering, Mathematics and Computer Science (EEMCS)
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Link to this item:http://purl.utwente.nl/publications/70926
Official URL:http://dx.doi.org/10.1002/qre.4680070412
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