Response to the comments of S. Kovatchev and A. Losev on "New approach for correction of distortions in spectral line profiles in Auger electron spectroscopy" by A.G.B.M. Sasse, H. Wormeester and A. van Silfhout

Wormeester, H. (1989) Response to the comments of S. Kovatchev and A. Losev on "New approach for correction of distortions in spectral line profiles in Auger electron spectroscopy" by A.G.B.M. Sasse, H. Wormeester and A. van Silfhout. Surface and Interface Analysis, 14 (8). p. 487. ISSN 0142-2421

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Item Type:	Article
Copyright:	© 1989 Wiley InterScience
Faculty:	Science and Technology (TNW)
Research Group:	Physics of Interfaces and Nanomaterials (PIN)
Link to this item:	http://purl.utwente.nl/publications/70884
Official URL:	http://dx.doi.org/10.1002/sia.740140812
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