Multiple reflections in an optical retarder investigated by spectroscopic transmission ellipsometry

Hanekamp, L.J. (1988) Multiple reflections in an optical retarder investigated by spectroscopic transmission ellipsometry. Optics Communications, 65 (4). pp. 261-263. ISSN 0030-4018

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Abstract:	The response of the ellipsometric parameters as a function of wavelength has been derived for an optical retarder. Experimental results in the wavelength region 400–1000 nm are given, these are in agreement with the derived formalism.
Item Type:	Article
Copyright:	© 1988 Elsevier Science
Research Group:	Solid State Physics (VSF)
Link to this item:	http://purl.utwente.nl/publications/70304
Official URL:	http://dx.doi.org/10.1016/0030-4018(88)90163-0
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