The impact of CMOS scaling projected on a 6b full-Nyquist non-calibrated flash ADC

Veldhorst, Paul and Guksun, George and Annema, Anne-Johan and Nauta, Bram and Buter, Berry and Vertregt, Maarten (2009) The impact of CMOS scaling projected on a 6b full-Nyquist non-calibrated flash ADC. In: ProRISC 2009, Annual Workshop on Circuits, Systems and Signal Processing, 26-27 Nov 2009, Veldhoven, the Netherlands.

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Abstract:	A 6-bit 1.2 Gs/s non-calibrated flash ADC in a standard 45nm CMOS process, that achieves 0.45pJ/conv-step at full Nyquist bandwidth, is presented. Power efficient operation is achieved by a full optimization of amplifier blocks, and by innovations in the comparator and encoding stage. The performance of a non-calibrated flash ADC is directly related to device properties; a scaling analysis of our ADC in and across CMOS technologies gives insight into the excellent usability of 45nm technology for AD converter design.
Item Type:	Conference or Workshop Item
Faculty:	Electrical Engineering, Mathematics and Computer Science (EEMCS)
Research Group:	Integrated Circuit Design (ICD)
Link to this item:	http://purl.utwente.nl/publications/70027
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