A 0.45pJ/conv-step 1.2Gs/s 6b full-Nyquist non-calibrated flash ADC in 45nm CMOS and its scaling behavior
Veldhorst, Paul and Goksun, George and Buter, Berry and Vertregt, Maarten and Annema, Anne-Johan and Nauta, Bram (2009) A 0.45pJ/conv-step 1.2Gs/s 6b full-Nyquist non-calibrated flash ADC in 45nm CMOS and its scaling behavior. In: European Solid-State Circuits Conference, ESSCIRC 2009, 14-18 September 2009, Greece, Athene (pp. pp. 464-467).
|Abstract:||A 6-bit 1.2 Gs/s non-calibrated flash ADC in a standard 45nm CMOS process, that achieves 0.45pJ/conv-step at full Nyquist bandwidth, is presented. Power efficient operation is achieved by a full optimization of amplifier blocks, and by innovations in the comparator and encoding stage. The performance of a non-calibrated flash ADC is directly related to device properties;
a scaling analysis of our ADC in and across CMOS technologies gives insight into the excellent usability of 45nm technology for AD converter design.
|Item Type:||Conference or Workshop Item|
|Copyright:||© 2009 IEEE|
Electrical Engineering, Mathematics and Computer Science (EEMCS)
|Link to this item:||http://purl.utwente.nl/publications/70007|
|Export this item as:||BibTeX|
Daily downloads in the past month
Monthly downloads in the past 12 months
Repository Staff Only: item control page
Metis ID: 265787