Design and characterization of SiON integrated optics components for optical coherence tomography


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Nguyen, V. Duc and Kalkman, J. and Ismail, N. and Sun, F. and Wörhoff, K. and Driessen, A. and Pollnau, M. and Leeuwen, T.G. van (2009) Design and characterization of SiON integrated optics components for optical coherence tomography. In: Lasers and Electro-Optics 2009 and the European Quantum Electronics Conference. CLEO Europe - EQEC 2009. European Conference on, 14-19 June 2009, Munich, Germany (pp. CL.P.14 THU).

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Abstract:Optical coherence tomography (OCT) is a technique for high resolution imaging of biological tissues with a depth range of a few millimeters. OCT is based on interferometry to enable depth ranging. Currently, optical components for OCT are rather bulky and expensive; the use of integrated optical circuits presents a great opportunity to reduce costs and enhance system functionality and performance. We present the design and characterization of SiON-based integrated optics waveguides, splitters, couplers and interferometers for OCT operating at a wavelength of 1.3 um.
Item Type:Conference or Workshop Item
Copyright:© 2009 IEEE
Faculty:
Electrical Engineering, Mathematics and Computer Science (EEMCS)
Science and Technology (TNW)
Research Group:
Link to this item:http://purl.utwente.nl/publications/69971
Official URL:http://dx.doi.org/10.1109/CLEOE-EQEC.2009.5192529
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