Energy Migration Governs Upconversion Losses in Er3+-doped Integrated Amplifiers

Agazzi, L. and Bradley, J.D.B. and Ay, F. and Kahn, A. and Scheife, H. and Huber, G. and Ridder de, R.M. and Wörhoff, K. and Pollnau, M. (2009) Energy Migration Governs Upconversion Losses in Er3+-doped Integrated Amplifiers. In: Conference on Lasers and Electro-Optics Europe, 14-19 June 2009, Munich, Germany.

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Abstract:	Using a microscopic model to describe energy-transfer upconversion, we find a direct correlation between the calculated onset of migration-accelerated upconversion and the experimental saturation of gain with dopant concentration in erbium-doped amplifiers.
Item Type:	Conference or Workshop Item
Copyright:	© 2009 IEEE
Faculty:	Electrical Engineering, Mathematics and Computer Science (EEMCS)
Research Group:	Integrated Optical MicroSystems (IOMS)
Link to this item:	http://purl.utwente.nl/publications/69945
Official URL:	http://dx.doi.org/10.1109/CLEOE-EQEC.2009.5196506
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