Multiterminal semiconductor/ferromagnet probes for spin-filter scanning tunneling microscopy

Vera Marún, I.J. and Jansen, R. (2009) Multiterminal semiconductor/ferromagnet probes for spin-filter scanning tunneling microscopy. Journal of Applied Physics, 105 (7). 07D520. ISSN 0021-8979

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Abstract:	We describe the fabrication of multiterminal semiconductor/ferromagnet probes for a new technique to study magnetic nanostructures: spin-filter scanning tunneling microscopy. We describe the principle of the technique, which is based on spin-polarized tunneling and subsequent analysis of the spin polarization using spin-dependent transmission in the probe tip. We report the fabrication of the probes having a submicron semiconductor/ferromagnet heterostructure at the end of the tip.
Item Type:	Article
Copyright:	© 2009 American Institute of Physics
Faculty:	Electrical Engineering, Mathematics and Computer Science (EEMCS)
Research Group:	Nano-Electronics (NE)
Link to this item:	http://purl.utwente.nl/publications/69069
Official URL:	http://dx.doi.org/10.1063/1.3068128
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