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An application of 200 KV to engineering materials
Beyer, J. (1982) An application of 200 KV to engineering materials. Ultramicroscopy, 9 (4). p. 403. ISSN 0304-3991
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| Item Type: | Article |
| Copyright: | © 1982 Elsevier Science |
| Link to this item: | http://purl.utwente.nl/publications/69020 |
| Official URL: | http://dx.doi.org/10.1016/0304-3991(82)90118-8 |
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