Two calculation procedures for the determination of composition and mass thickness of thin samples by x-ray spectrometry

Willigen van, J.H.H.G. and Weber, H.T. and Bos, M. and Linden van der, W.E. (1982) Two calculation procedures for the determination of composition and mass thickness of thin samples by x-ray spectrometry. Analytica Chimica Acta, 136 . pp. 379-384. ISSN 0003-2670

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Abstract:	Two procedures are described for calculating the composition and mass thickness of thin samples from measured x-ray intensities. One procedure is suitable for use with a programmable hand calculator but gives correct results only for very thin samples. The other procedure utilizes the NRLXRF program and produces correct results for thin and thick films.
Item Type:	Article
Copyright:	© 1982 Elsevier Science
Link to this item:	http://purl.utwente.nl/publications/68987
Official URL:	http://dx.doi.org/10.1016/S0003-2670(01)95400-5
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