Two calculation procedures for the determination of composition and mass thickness of thin samples by x-ray spectrometry

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Willigen van, J.H.H.G. and Weber, H.T. and Bos, M. and Linden van der, W.E. (1982) Two calculation procedures for the determination of composition and mass thickness of thin samples by x-ray spectrometry. Analytica Chimica Acta, 136 . pp. 379-384. ISSN 0003-2670

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Abstract:Two procedures are described for calculating the composition and mass thickness of thin samples from measured x-ray intensities. One procedure is suitable for use with a programmable hand calculator but gives correct results only for very thin samples. The other procedure utilizes the NRLXRF program and produces correct results for thin and thick films.
Item Type:Article
Copyright:© 1982 Elsevier Science
Link to this item:http://purl.utwente.nl/publications/68987
Official URL:http://dx.doi.org/10.1016/S0003-2670(01)95400-5
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