Determination of young's modulus of PZT and Co80Ni20 thin films by means of micromachined cantilevers

Share/Save/Bookmark

Nazeer, H. and Abelmann, L. and Tas, N.R. and Honschoten van, J.W. and Siekman, M.H. and Elwenspoek, M.C. (2009) Determination of young's modulus of PZT and Co80Ni20 thin films by means of micromachined cantilevers. In: MME 2009, The 20th Micromechanics Europe Workshop, September 20-22, 2009, Toulouse, France.

[img]PDF
Restricted to UT campus only
: Request a copy
243Kb
Abstract:This paper presents a technique to determine the Young’s modulus and residual stress of thin films using a simple micromachined silicon cantilever as the test structure. An analytical relation was developed based on the shift in
resonance frequency caused by the addition of a thin film on the cantilever. FEM simulations were performed which confirmed the validity of assumptions made in our analytical model.
Resonance frequency measurements both before and after the deposition of the thin film improve the accuracy of the results. Experiments were performed on PZT deposited by pulsed laser deposition and on evaporated Co80Ni20 thin films.
Item Type:Conference or Workshop Item
Faculty:
Electrical Engineering, Mathematics and Computer Science (EEMCS)
Research Group:
Link to this item:http://purl.utwente.nl/publications/68054
Export this item as:BibTeX
EndNote
HTML Citation
Reference Manager

 

Repository Staff Only: item control page

Metis ID: 264014