The influence of technology variation on ggNMOSTs and SCRs against CDM ESD stress

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Sowariraj, M.S.B. and Salm, C. and Mouthaan, A.J. and Smedes, T. and Kuper, F.G. (2002) The influence of technology variation on ggNMOSTs and SCRs against CDM ESD stress. Microelectronics Reliability, 42 (9-11). pp. 1287-1292. ISSN 0026-2714

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Abstract:In this paper we present a systematic study on the effect of process and layout variation for grounded-gate NMOSTs and LVTSCRs in a 0.18
Item Type:Article
Faculty:
Electrical Engineering, Mathematics and Computer Science (EEMCS)
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Link to this item:http://purl.utwente.nl/publications/67755
Official URL:http://dx.doi.org/10.1016/S0026-2714(02)00136-1
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